Reliability evaluation of isolated buck-boost DC-DC series resonant converter
statement of authorship
Abualkasim Bakeer, Andrii Chub, Yanfeng Shen
publisher
journal volume number month
vol. 3
year of publication
pages
p. 131-141
ISSN
2644-1314
notes
Bibliogr.: 31 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
language
inglise
subject term
keyword
MIL-HDBK-217F handbook
FIDES approach
classifier
kvartiil
category (general)
category (sub)
TTÜ department
Reserch Group
Bakeer, A., Chub, A., Shen, Y. Reliability evaluation of isolated buck-boost DC-DC series resonant converter // IEEE open journal of power electronics (2022) vol. 3, p. 131-141.