Wear-out failure analysis of solar optiverter operating with 60- and 72-cell Si crystalline PV modules
author
Liivik, Liisa
Chub, Andrii
Sangwongwanich, Ariya
Shen, Yanfeng
Vinnikov, Dmitri
Blaabjerg, Frede
statement of authorship
Elizaveta Liivik, Andrii Chub, Ariya Sangwongwanich, Yanfeng Shen, Dmitri Vinnikov, Frede Blaabjerg
source
IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2018
pages
p. 6134-6140 : ill
conference name, date
44th Annual Conference of the IEEE Industrial Electronics Society (IECON 2018), 20-23 October, 2018
conference location
Washington, DC, USA
url
https://doi.org/10.1109/IECON.2018.8592925
subject term
fotogalvaanika
töökindlus
kulumine (tehnika)
modelleerimine (teadus)
keyword
wear-out failure
optiverter
photovoltaic module
reliability
ISBN
978-1-5090-6684-1
notes
Bibliogr.: 31 ref
TalTech department
elektroenergeetika ja mehhatroonika instituut
language
inglise
Reserch Group
Power electronics group