Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Artur Jutman, Raimund Ubar
source
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
location of publication
[S.l.]
year of publication
2002
pages
p. 19-20
notes
Bibliogr.: 6 ref