Identification of drivable road area from orthophotos using a convolutional neural network
author                    
                    
                
statement of authorship                    
                    
Andri Riid, René Pihlak, Raul Liinev
                            
                    
source                    
                    
                
location of publication                    
                    
Danvers
                            
                    
publisher                    
                    
                
year of publication                    
                    
                
pages                    
                    
5 p. : ill
                            
                    
conference name, date                    
                    
17th Biennial Baltic electronics conference (BEC 2020), October 6-8, 2020
                            
                    
conference location                    
                    
Tallinn, Estonia
                            
                    
subject term                    
                    
                
keyword                    
                    
                
ISSN                    
                    
1736-3705
                            
                    
ISBN                    
                    
978-1-7281-9445-5
                            
                    
notes                    
                    
Bibliogr.: 12 ref
                            
                    
TalTech department                    
                    
                
language                    
                    
inglise
                            
                    
                Reserch Group
            
            
        
                            Riid, A., Pihlak, R., Liinev, R. Identification of drivable road area from orthophotos using a convolutional neural network // 2020 17th Biennial Baltic electronics conference, Tallinn, Estonia, October 6-8, 2020 : proceedings. Danvers : IEEE, 2020. 5 p. : ill.