compact view print

Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties

author
Kropman, Daniel
Kärner, Tiit
Dolgov, Sergei
Heinmaa, Ivo
Laas, Tõnu
Londos, C. A.
statement of authorship
D. Kropman, T. Kärner, S. Dolgov, I. Heinmaa, T. Laas, C. A. Londos
source
The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest
location of publication
Riga
publisher
RTU Publishing House
year of publication
2010
pages
p. 231-233
conference name, date
The 9th International Conference on Global Research and Education, August 9-12, 2010
conference location
Riga
url
https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564
subject term
õhukesed kiled
tuumamagnetresonants
magnetresonants
ISBN
978-9934-10-046-8
language
inglise
Kropman, D., Kärner, T., Dolgov, S., Heinmaa, I., Laas, T., Londos, C. A. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties // The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest. Riga : RTU Publishing House, 2010. p. 231-233. https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564