Explorations in low area overhead DfT techniques for sequential BIST
author
Raik, Jaan
Raidma, Rein
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Rein Raidma, Raimund Ubar
source
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
location of publication
[S. l.]
year of publication
2003
pages
p. 220-223 : ill
ISBN
87-982637-5-7
notes
Bibliogr.: 12 ref