Eidukas, D., Balaišis, P., Navikas, D.

Systematic analysis of electronic devices reliability

author

Eidukas, D.

Balaišis, P.

Navikas, D.

statement of authorship

D.Eidukas, P.Balaišis, D.Navikas

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 255-258: ill

ISBN

9985-59-081-3

notes

Bibl. 4 ref

Eidukas, D., Balaišis, P., Navikas, D. Systematic analysis of electronic devices reliability // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 255-258: ill.