Comparison of model-based error localization algorithms for C designs
author
Repinski, Urmas
Raik, Jaan
statement of authorship
Repinski, Urmas, Raik, Jaan
source
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012
location of publication
[S.l.]
publisher
IEEE Computer Society
year of publication
2012
pages
p. 42-45
conference name, date
10th IEEE East-West Design & Test Symposium (EWDTS), September 14-17, 2012
conference location
Kharkov, Ukraine
language
inglise