Side-channel attacks on triple modular redundancy schemes

statement of authorship
Felipe Almeida, Levent Aksoy, Jaan Raik, and Samuel Pagliarini
source
2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings
publisher
year of publication
pages
p. 79-84 : ill
conference name, date
2021 IEEE 30th Asian Test Symposium ATS 2021, 22-25 November 2021
conference location
Matsuyama, Ehime, Japan
kvartiil
Q3
category (general)
keyword
triple modular redundancy
advanced encryption standard
ISSN
2377-5386
ISBN
978-1-6654-4051-6
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
language
inglise