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Fault diagnosis in VLSI devices

author
Ubar, Raimund-Johannes
statement of authorship
Raimund Ubar
source
Proceedings of the Estonian Academy of Sciences. Engineering
journal volume number month
1
year of publication
1995
pages
1, p. 51-67
subject term
integraallülitused
rikked
diagnostika (tehnika)
ISSN
1406-0175
notes
Bibl. 18 ref
review
Kokkuvõte: Suurte integraalskeemide rikete diagnostika
Резюме: Раймунд Убар. Диагностика неисправностей в больших интегральных схемах
language
inglise
Ubar, R. Fault diagnosis in VLSI devices // Proceedings of the Estonian Academy of Sciences. Engineering (1995) 1, 1, p. 51-67.