Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networks

statement of authorship
R.Ubar, S.Kostin, J.Raik
source
ASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 2009
location of publication
New York
publisher
year of publication
pages
p. 385-390
ISBN
978-1-4244-4951-4
notes
Bibliogr.: 12 ref
language
inglise
Ubar, R.-J., Kostin, S., Raik, J. Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networks // ASQED'09 : 1st Asia Symposium on Quality Electronic Design : Kuala Lumpur, Malaisia, July 15-16, 2009. New York : IEEE, 2009. p. 385-390. https://ieeexplore.ieee.org/document/5206232