Fault diagnosis in integrated circuits with BIST
author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
Evartson, Teet
Lensen, Harri
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen
source
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2007
pages
p. 604-610 : ill
conference name, date
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
conference location
Lübeck, Germany
url
http://dx.doi.org/10.1109/DSD.2007.4341530
subject term
integraallülitused
rikked
diagnostika (tehnika)
ISBN
978-0-7695-2978-3
notes
Bibliogr.: 16 ref
TalTech department
arvutitehnika instituut
language
inglise