Electron microscopy study of contact layers in n-type 4H-SiC after diffusion welding
author
Korolkov, Oleg
Sleptšuk, Natalja
Sitnikova, A.
Rang, Toomas
statement of authorship
O.Korolkov, N.Sleptsuk, A.Sitnikova, and T.Rang
source
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2008
pages
p. 91-94 : ill
conference name, date
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : the 11th Biennial Baltic Electronics Conference, October 6-8, 2008
conference location
Tallinn, Estonia
subject term
elektronmikroskoopia
ränikarbiid
piirpinnad
keevitus
difusioon (füüsika)
ISSN
1736-3705
ISBN
978-1-4244-2059-9
notes
Bibliogr.: 7 ref
TalTech department
elektroonikainstituut
language
inglise