Parallel X-fault simulation with critical path tracing technique [Electronic resource]
author
Ubar, Raimund-Johannes
Devadze, Sergei
Raik, Jaan
Jutman, Artur
statement of authorship
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
source
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
location of publication
[Dresden]
publisher
IEEE
year of publication
2010
pages
p. 879-884 [CD-ROM]
conference name, date
DATE : Design, Automation & Test in Europe, 8-12 March, 2010
conference location
Dresden, Germany
ISBN
978-3-9810801-6-2
language
inglise