Functional level testability analysis for digital circuits
statement of authorship
Raimund Ubar, Krzysztof Kuchcinski
source
ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993
location of publication
Rotterdam
year of publication
pages
p. 545-546
subject term
notes
Bibl. p. 546
language
inglise
Ubar, R., Kuchcinski, K. Functional level testability analysis for digital circuits // ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993. Rotterdam, 1993. p. 545-546.