Fault oriented test pattern generation for sequential circuits using Genetic Algorithms
author
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Eero Ivask, Jaan Raik, Raimund Ubar
source
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
location of publication
[Tallinn]
publisher
Tallinn Technical University
year of publication
2000
pages
p. 129-132 : ill
ISBN
9985-59-179-8
notes
Bibliogr.: 13 ref