Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits
author
Pagliarini, Samuel Nascimento
Benites, Luis
Martins, Mayler
Rech, Paolo
Kastensmidt, Fernanda
statement of authorship
Samuel Pagliarini, Luis Benites, Mayler Martins, Paolo Rech, Fernanda Kastensmidt
source
IEEE transactions on nuclear science
publisher
IEEE
journal volume number month
vol. 68, 5
year of publication
2021
pages
p. 1045-1053
url
https://doi.org/10.1109/TNS.2021.3070643
subject term
riistvara
rikked
optimeerimine
integraallülitused
keyword
circuit synthesis
logic synthesis
radiation hardening
redundancy
ISSN
0018-9499
notes
Bibliogr.: 23 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/17368
https://www.scopus.com/record/display.uri?eid=2-s2.0-85103797089&origin=inward&txGid=6c92c2fbb6cf4232257945f91e1079ba
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20NUCL%20SCI&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000655537500073
category (general)
Energy
Energia
Physics and astronomy
Füüsika ja astronoomia
Engineering
Tehnika
category (sub)
Energy. Nuclear energy and engineering
Energia. Tuumaenergia ja -tehnika
Physics and astronomy. Nuclear and high energy physics
Füüsika ja astronoomia. Tuuma- ja kõrgenergiafüüsika
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
quartile
Q2
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for hardware security