Automated test bench generation for high-level synthesis flow ABELITE

statement of authorship
Taavi Viilukas, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Samary Baranov
source
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 2011
location of publication
[Kharkov]
year of publication
pages
p. 13-16 : ill
conference name, date
IEEE East-West Design & Test Symposium (EWDTS'2011), September 9-12, 2011
conference location
Sevastopol, Ukraine
notes
Bibliogr.: 11 ref
language
inglise
Viilukas, T., Jenihhin, M., Raik, J., Ubar, R., Baranov, S. Automated test bench generation for high-level synthesis flow ABELITE // Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 2011. [Kharkov] : Kharkov National University of Radioelectronics, 2011. p. 13-16 : ill. https://ieeexplore.ieee.org/document/6116601