Double deep Q-Learning approach for tuning microwave cavity filters using locally linear embedding technique
author
Sekhri, Even
Kapoor, Rajiv
Tamre, Mart
statement of authorship
Even Sekhri, Rajiv Kapoor, Mart Tamre
source
2020 International Conference Mechatronic Systems and Materials (MSM)
publisher
IEEE
year of publication
2020
pages
6 p. : ill
conference name, date
2020 International Conference Mechatronic Systems and Materials (MSM), 2020
conference location
Bialystok, Poland
url
https://doi.org/10.1109/MSM49833.2020.9202393
subject term
tehisõpe
filtrid
mikrolained
keyword
Microwave Cavity Filter Tuning
LLE
DDQN
RL
Computer-Aided Tuning
Q-Learning
Deep Learning (DL)
ISBN
978-1-7281-6956-9
notes
Bibliogr.: 29 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
elektroenergeetika ja mehhatroonika instituut
language
inglise