Untestable fault identification in sequential circuits using model-checking
author
Raik, Jaan
Fujiwara, Hideo
Ubar, Raimund-Johannes
Krivenko, Anna
statement of authorship
Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko
source
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
location of publication
Los Alamitos
publisher
IEEE Computer Society Press
year of publication
2008
pages
p. 21-26 : ill
conference name, date
17th Asian Test Symposium, November 24-27, 2008
conference location
Sapporo, Japan
url
http://dx.doi.org/10.1109/ATS.2008.22
subject term
integraallülitused
rikked
ISSN
1081-7735
ISBN
978-0-7695-3396-4
notes
Bibliogr.: 11 ref
TTÜ department
arvutitehnika instituut
language
inglise