Numerical simulation of electrothermal effects in ESD protection devices
author
statement of authorship
Hellstrom, S., Freydin, B., Velmre, E., Udal, A.
source
Techn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwabisch Gmünd, Germany
year of publication
Hellstrom, S., Freydin, B., Velmre, E., Udal, A. Numerical simulation of electrothermal effects in ESD protection devices // Techn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwabisch Gmünd, Germany., 1992.