Reliability of electroencephalogram-based individual markers - case study
author
Uudeberg, Tuuli
Päeske, Laura
Hinrikus, Hiie
Lass, Jaanus
Bachmann, Maie
statement of authorship
Tuuli Uudeberg, Laura Päeske, Hiie Hinrikus, Jaanus Lass, Mare Bachmann
source
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)
location of publication
Pistcataway, NJ
publisher
IEEE
year of publication
2020
pages
p. 276 - 279
series
Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS ; Volume 2020-July
conference name, date
42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society, EMBC 2020, 20-24 July 2020
conference location
Montreal, Canada
url
https://doi.org/10.1109/EMBC44109.2020.9175274
subject term
peaaju
fraktaalid
elektroentsefalograafia
psüühikahäired
Scopus
Conference Proceedings at Scopus
Article at Scopus
WOS
Article at WOS
kvartiil
Q3
category (general)
Computer science
en
Arvutiteadus
et
Medicine
en
Meditsiin
et
Engineering
en
Tehnika
et
category (sub)
Computer science. Computer vision and pattern recognition
en
Arvutiteadus. Arvutinägemine ja mustrituvastus
et
Computer science. Signal processing
en
Arvutiteadus. Signaalitöötlus
et
Medicine. Health informatics
en
Meditsiin. Terviseinformaatika
et
Engineering. Biomedical engineering
en
Tehnika. Biomeditsiinitehnika
et
keyword
brain
fractal dimension
electroencephalography
ISSN
1557-170X
ISBN
978-172811990-8
notes
Bibliogr.: 34 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
tervisetehnoloogiate instituut
language
inglise
Uurimisrühm
Brain bioelectrical signals research group