Yakushev, M.V., Maiello, P., Raadik, T., Krustok, J. et al.

full record print

Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics

author

Yakushev, M.V.

Maiello, P.

Raadik, Taavi

Krustok, Jüri

statement of authorship

M.V. Yakushev, P. Maiello, T. Raadik, ... J. Krustok, ... [et al.]

source

Thin solid films

journal volume number month

Vol. 562

year of publication

2014

pages

p. 195-199 : ill

ISSN

0040-6090

notes

Bibliogr.: 29 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

päikeseelemendid

õhukesed kiled

pooljuhtkiled

spektroskoopia

fotoluminestsents

keyword

thin films

solar cells

semiconductors

electronic structure

Raman spectroscopy

photoreflectance

photoluminescence

TalTechi üksused

TTÜ department

materjaliteaduse instituut

Yakushev, M.V., Maiello, P., Raadik, T., Krustok, J. et al. Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics // Thin solid films (2014) Vol. 562, p. 195-199 : ill.