Method of samples preparation intended for research of deep centers in i-, n-, and p-layers of GaAs p+-pin-n+ structures and result of analysis

statement of authorship
J. Toompuu, N. Sleptsuk, O. Korolkov, T. Rang
location of publication
Tallinn
year of publication
pages
p. 35-38 : ill
conference name, date
BEC 2016 : 15th Biennial Baltic Electronics Conference, October 3-5, 2016
conference location
Tallinn, Tallinn University of Technology
ISBN
978-1-5090-1392-0
notes
Bibliogr.: 6 ref
language
inglise