Marginal PCB assembly defect detection on DDR3/4 memory bus
author
Odintsov, Sergei
Jutman, Artur
Devadze, Sergei
statement of authorship
Sergei Odintsov, Artur Jutman and Sergei Devadze
source
2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 238-247 : ill
conference name, date
48th International Test Conference (ITC), 31 October - 2 November 2017
conference location
Fort Worth, USA
url
https://doi.org/10.1109/TEST.2017.8242070
subject term
tarkvaraarendus
rikked
mäluseadmed
Scopus
https://www.scopus.com/sourceid/25589
https://www.scopus.com/record/display.uri?eid=2-s2.0-85038601577&origin=inward&txGid=69af237766f73a4c6e2ae7c6c9a1d423
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000426969200041
quartile
Q3
category (general)
Mathematics
Matemaatika
Engineering
Tehnika
category (sub)
Mathematics. Applied mathematics
Matemaatika. Rakendusmatemaatika
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
ISSN
1089-3539
ISBN
978-1-5386-3414-1
notes
Bibliogr.: 20 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise