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Identifying NBTI-critical paths in nanoscale logic

author
statement of authorship
Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Bolzani Poehls
source
16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain
location of publication
[S.l.]
publisher
CPS
year of publication
pages
p. 136-141 : ill
conference name, date
16th Euromicro Conference series on Digital System Design (DSD 2013), 4-6 September, 2013
conference location
Santander, Spain
ISBN
978-0-7695-5074-9
notes
Bibliogr.: 8 ref
TTÜ department
language
inglise
subject term
keyword
NBTI-critical path
path identification
aging
logic circuit
Ubar, R., Vargas, F., Jenihhin, M., Raik, J., Kostin, S., Bolzani Poehls, L. Identifying NBTI-critical paths in nanoscale logic // 16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain. [S.l.] : CPS, 2013. p. 136-141 : ill.