Improving statistical approach for memory leak detection using machine learning

author
Šor, Vladimir
Srirama, Satish Narayana
statement of authorship
Vladimir Šor, Tarvo Treier, Satish Narayana Srirama
source
2013 IEEE International Conference on Software Maintenance : 22–28 September 2013, Eindhoven, The Netherlands : proceedings
location of publication
Piscataway
publisher
year of publication
pages
p. 544-547
conference name, date
29th IEEE International Conference on Software Maintenance, 22-28 September, 2013
conference location
Eindhoven, the Netherlands
ISSN
1063-6773
ISBN
978-0-7685-4981-1
notes
Bibliogr.: 25 ref
TTÜ department
language
inglise
Šor, V., Treier, T., Srirama, S.V. Improving statistical approach for memory leak detection using machine learning // 2013 IEEE International Conference on Software Maintenance : 22–28 September 2013, Eindhoven, The Netherlands : proceedings. Piscataway : IEEE, 2013. p. 544-547.