Measurement of the lifetime of nonequilibrium charge carriers in silicon using photoelectric methods
statement of authorship
Aleksander Graf, Aleksei Gavrilov, Pavel Suurvarik
journal volume number month
Vol. 6, 4
year of publication
pages
p. 26-31 : ill
subject term
keyword
methods of measuring
nonequilibrium charge carriers
lifetime of carriers
ISSN
2305-8269
notes
Bibliogr.: 2 ref
TTÜ department
language
inglise
Graf, A., Gavrilov, A., Suurvarik, P. Measurement of the lifetime of nonequilibrium charge carriers in silicon using photoelectric methods // International journal of engineering and applied sciences (EAAS) (2015) Vol. 6, 4, p. 26-31 : ill.