Reconstructing timed symbolic traces from rtioco-based timed test sequences using backward induction
                                            statement of authorship
                                    
                                    
Junaid Iqbal, Dragos Truscan, Juri Vain, and Ivan Porres
                                                    
                                            
                                            source
                                    
                                    
Proceedings of the Fifth European Conference on the Engineering of Computer-Based Systems
                                                    
                                            
                                            location of publication
                                    
                                    
New York
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
10 pages : ill
                                                    
                                            
                                            conference name, date
                                    
                                    
ECBS '17 Fifth European Conference on the Engineering of Computer Based Systems, 31 august- 01 september, 2017
                                                    
                                            
                                            conference location
                                    
                                    
Larnaca, Cyprus
                                                    
                                            
                                            ISBN
                                    
                                    
978-1-4503-4843-0
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 29 ref
                                                    
                                            
                                            scientific publication
                                    
                                    
teaduspublikatsioon
                                                    
                                            
                                            TalTech department
                                    
                                    
                                
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                                            keyword
                                    
                                    
rtioco-based timed test sequences
                                                    
                                                    
timed symbolic traces
                                                    
                                                    
diagnostic traces
                                                    
                                                    
Uppaal model-checker
                                                    
                                                    
Uppaal Tron
                                                    
                                                    
                                                    
backward-induction
                                                    
                                            
                                            WOS
                                    
                                    
                                
                                            quartile
                                    
                                    
                                
                                            classifier
                                    
                                    
                                
                                    Iqbal, J., Truscan, D., Vain, J., Porres, I. Reconstructing timed symbolic traces from rtioco-based timed test sequences using backward induction // Proceedings of the Fifth European Conference on the Engineering of Computer-Based Systems. New York : ACM, 2017. 10 pages : ill.  https://doi.org/10.1145/3123779.3123813