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Marginal PCB assembly defect detection on DDR3/4 memory bus

author
Odintsov, Sergei
Jutman, Artur
Devadze, Sergei
statement of authorship
Sergei Odintsov, Artur Jutman and Sergei Devadze
source
2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017
location of publication
[S.l.]
publisher
IEEE
year of publication
2017
pages
p. 238-247 : ill
conference name, date
48th International Test Conference (ITC), 31 October - 2 November 2017
conference location
Fort Worth, USA
url
https://doi.org/10.1109/TEST.2017.8242070
subject term
tarkvaraarendus
rikked
mäluseadmed
ISBN
978-1-5386-3414-1
notes
Bibliogr.: 20 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Odintsov, S., Jutman, A., Devadze, S. Marginal PCB assembly defect detection on DDR3/4 memory bus // 2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017. [S.l.] : IEEE, 2017. p. 238-247 : ill. https://doi.org/10.1109/TEST.2017.8242070