RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design
author
statement of authorship
C.C. Gürsoy, G. Medeiros, J. Chen, N. George, J.E. Rodriguez Condia, T.Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S. Hamdioui, M. Taouil, M. Krstic, P. Langendörfer, Z. Dyka, M. Huebner, J. Nolte , G. Squillero, L. Sterpone, J. Raik, D. Alexandrescu, M. Glorieux, G. Selimis, G.J. Schrijen, A. Klotz, C. Sauer, M. Jenihhin
source
DATE 2019
location of publication
[S.l.]
year of publication
pages
1 p. : ill
conference name, date
2019 Design Automation and Test in Europe Conference (UB DATE), 25-29 March, 2019
conference location
Florence, Italy
subject term
keyword
nanoelectronic systems design
TTÜ department
language
inglise
Gürsoy, C. C., Medeiros, G., Chen, J., Balakrishnan, A., Lai, X., Bagbaba, A. C. Raik, J., Jenihhin, M. et al. RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design // DATE 2019. [S.l.], 2019. 1 p. : ill.