A fault-resistant architecture for AES S-box architecture
author
statement of authorship
Mahdi Taheri, Saeideh Sheikhpour, Mohammad Saeed Ansari, Ali Mahani
publisher
journal volume number month
vol. 1, 1
year of publication
pages
p. 86-92
ISSN
2717-414X
2783-2864
Open Access
Open Access (kuldne)
scientific publication
teaduspublikatsioon
language
inglise
subject term
keyword
fault-resistant
advanced encryption standard (AES)
S-box
high-speed
classifier
TTÜ department
Taheri, M., Sheikhpour, S., Ansari, M. S., Mahani, A. A fault-resistant architecture for AES S-box architecture // Journal of Applied Research in Electrical Engineering (2021) vol. 1, 1, p. 86-92. https://doi.org/10.22055/jaree.2021.36230.1020