Tverjanovich, A., Benmore, C. J., Khomenko, M., Sokolov, A., Fontanari, D., Bereznev, S., Bokova, M., Kassem, M., Bychkov, E.

Decoding the atomic structure of Ga2Te5 pulsed laser deposition films for memory applications using diffraction and first-principles simulations

author

Tverjanovich, Andrey

Benmore, Chris J.

Khomenko, Maxim

Sokolov, Anton

Fontanari, Daniele

Bereznev, Sergei

Bokova, Maria

Kassem, Mohammad

Bychkov, Eugene

statement of authorship

by Andrey Tverjanovich, Chris J. Benmore, Maxim Khomenko, Anton Sokolov, Daniele Fontanari, Sergei Bereznev, Maria Bokova, Mohammad Kassem and Eugene Bychkov

source

Nanomaterials

special issue

Special Issue "Synchrotron Radiation in Nanomaterials Research: A Themed Issue in Honor of Dr. Claudio Ferrero"

publisher

MDPI

journal volume number month

vol. 13, 14

year of publication

2023

pages

art. 2137

url

https://doi.org/10.3390/nano13142137

subject term

materjalid

energiatõhusus

temperatuur

galliumiühendid

keyword

phase-change materials

synchrotron diffraction

first-principles molecular dynamics

ISSN

2079-4991

Open Access

scientific publication

teaduspublikatsioon

classifier

1.1

TTÜ department

materjali- ja keskkonnatehnoloogia instituut

language

inglise

Tverjanovich, A., Benmore, C. J., Khomenko, M., Sokolov, A., Fontanari, D., Bereznev, S., Bokova, M., Kassem, M., Bychkov, E. Decoding the atomic structure of Ga2Te5 pulsed laser deposition films for memory applications using diffraction and first-principles simulations // Nanomaterials (2023) vol. 13, 14, art. 2137. https://doi.org/10.3390/nano13142137