Intelligent diagnostic centers: a new way to distributed fault-tolerance

author
Tilly, K.
Vadasz, B.
Kiss, I.
statement of authorship
A.R.Varkonyi-Koczy, K.Tilly, T.Dobrowiecki, B.Vadasz, I.Kiss
location of publication
Tallinn
year of publication
pages
p. 365-368: ill
ISBN
9985-59-012-0
notes
Bibl. 11 ref
Varkonyi-Koczy, A.R., Tilly, K., Dobrowiecki, T., Vadasz, B., Kiss, I.* Intelligent diagnostic centers: a new way to distributed fault-tolerance // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 365-368: ill.