Reliability in microsystems
author
Michel, Bernd
Schubert, A.
Reichl, H.
statement of authorship
B.Michel, A.Schubert and H.Reichl
location of publication
[Tallinn]
year of publication
pages
p. 37-40: ill
ISBN
9985-59-026-0
notes
Bibl. 9 ref
Michel, B., Schubert, A., Reichl, H. Reliability in microsystems // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 37-40: ill.