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2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan (source)
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book article EST
/
book article ENG
Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs
Pellerey, Francesco
;
Jenihhin, Maksim
;
Squillero, Giovanni
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan
2016
/
p. 304-309 : ill
https://doi.org/10.1109/ATS.2016.57
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
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