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Machine learning to tackle the challenges of transient and soft errors in complex circuits (title)
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book article
Machine learning to tackle the challenges of transient and soft errors in complex circuits
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece
2019
/
p. 7-14 : ill
https://doi.org/10.1109/IOLTS.2019.8854423
book article
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keyword
3
1.
Single Event Transient (SET) and Soft Errors
2.
soft errors
3.
SIS problem, learning with errors
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