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ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France (source)
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book article
SiC-diodes forward surge current failure mechanisms : experiment and simulation
Velmre, Enn
;
Udal, Andres
ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France
1997
/
p. 1671-1674
https://www.sciencedirect.com/science/article/abs/pii/S0026271497001364
book article
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