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Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model (title)
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book article
Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model
Ubar, Raimund-Johannes
;
Borrione, Dominique
XI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings
1998
/
p. 51-54
https://ieeexplore.ieee.org/document/715409
book article
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