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An iterative approach to test time minimization for parallel hybrid BIST architecture (title)
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book article
An iterative approach to test time minimization for parallel hybrid BIST architecture
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Z.
5th IEEE Latin-American Test Workshop - LATW 2004 : Cartagena, Colombia, 2004 : digest of papers
2004
/
p. 98-103 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/latw04.pdf
book article
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keyword
4
1.
hybrid BIST
2.
parallel hybrid electrical vehicle
3.
parallel design and test
4.
hybrid approach
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