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DOT: new deterministic defect-oriented ATPG tool (title)
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book article
DOT: new deterministic defect-oriented ATPG tool
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Sudbrock, Joachim
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 96-101 : ill
book article
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