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2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 2 (source)
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book article
Embedded diagnosis in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 2
2008
/
p. 421-424 : ill
book article
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