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RT-level identification of potentially testable initialization faults (title)
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book article
RT-level identification of potentially testable initialization faults
Raik, Jaan
;
Fujiwara, Hideo
;
Krivenko, Anna
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
2008
/
[6] p
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
book article
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keyword
2
1.
Cross-level Modeling of Faults in Digital Systems
2.
high-level control faults
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