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Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France (source)
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1
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
Number of records 1, displaying
1 - 1
CV
26
1.
Bogdanova, Klavdia 1927-2010
2.
Elken, Siina 1927-2010
3.
Jaek, Ivar 1930-2010
4.
Kallisaar, Alfred 1923-2010
5.
Kodumets, Mati 1962-2010
6.
Koitel, Heinu 1937-2010
7.
Kuldma, Toivo 1954-2010
8.
Laugis, Juhan 1938-2010
9.
Mõttus, Arvo 1926-2010
10.
Nagelman, Osvald 1931-2010
11.
Palover, Ester 1931-2010
12.
Plaks, Ferdinand 1919-2010
13.
Priks, Elvo 1929-2010
14.
Põldme, Juta 1942-2010
15.
Ritso, Aadu 1915-2010
16.
Roots, Harry 1950-2010
17.
Saa, Elmar 1938-2010
18.
Saarma, Rein 1944-2010
19.
Tamm, Eduard 1914-2010
20.
Taniloo, Rainer 1962-2010
21.
Trapezontsev, Grigori 1920-2010
22.
Treumann, Maili 1949-2010
23.
Vitsur, Endel 1926-2010
24.
Väljamäe, Gunnar 1927-2010
25.
Vällo, Arnold 1930-2010
26.
Vään, Julia (2010-)
name of the person
11
1.
Cohen, Samuel Theodore, 1921–2010
2.
Keres, Harald, 1912-2010
3.
Kärner, Jüri, 1940-2010
4.
Laugis, Juhan, 1938-2010
5.
Loosme, Ingrid, 1925-2010
6.
Mõttus, Arvo, 1926-2010
7.
Palm, Viktor, 1926-2010
8.
Pesti, Arvo, 1956-2010
9.
Reintam, Loit, 1929-2010
10.
Ritso, Aadu, 1915-2010
11.
Vällo, Arnold, 1930-2010
subject term
5
1.
EXPO 2010 (Shanghai)
2.
Lissaboni strateegia (2000-2010)
3.
Raamatukogupäevad (2010)
4.
2010-2019
5.
2010-ndad
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