Pattern based analysis of fractal manufacturing systems [Electronic resource]Jääger, Kadi; Vain, JüriINCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings2005 / [6] p. [CD-ROM] https://www.sciencedirect.com/science/article/pii/S1474667017361529