APPRAISER : DNN fault resilience analysis employing approximation errorsTaheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)2023 / p. 124−127 https://ddecs2023.taltech.ee/ https://doi.org//10.1109/DDECS57882.2023.10139468

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS