Critical analysis of uncertainty relations based on signal duration and spectrum widthUdal, Andres; Kukk, Vello; Velmre, EnnElektronika ir elektrotechnika = Electronics and electrical engineering2009 / p. 31-34 : ill https://www.ester.ee/record=b1200105*est https://eejournal.ktu.lt/index.php/elt/article/view/10098