Statistical Analysis-Based Feature Selection for Anomaly Detection in AIS DatasetVisky, Gabor; Vaarandi, Risto; Katsikas, Sokratis; Maennel, Olaf Manuel2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics (SAMI)2025 / p. 000159-000164 https://doi.org//10.1109/SAMI63904.2025.10883201