Non-linear structure identification of a fed-batch bakers' yeast process - a simulation study of two techniquesKeulers, M.; Sepp, K.; Breur, A.; Reyman, G.Automation, simulation & measurement. Section A, Automation. Section M, Measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991 = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 82-87: ill https://www.ester.ee/record=b1064034*est