Register-transfer level deductive fault simulation using decision diagramsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 193-196 : ill